الفهرس الالي لمكتبة كلية العلوم و علوم التكنولوجيا

An introduction to surface analysis by XPS and AES / John F. Watts

Public ISBD Titre : An introduction to surface analysis by XPS and AES Type de document : texte imprimé Auteurs : John F. Watts, Auteur ; John Wolstenholme Editeur : Chichester, West Sussex, England : J. Wiley Année de publication : 2003 Importance : x, 212 p. Présentation : ill. Format : 24 cm ISBN/ISSN/EAN : 0-470-84712-3 Note générale : Éditeur : John Wiley & Sons Ltd; 2nd Revised edition (21 mars 2003) Langue : Anglais Relié : 224 pages ISBN-10 : 0470847123 ISBN-13 : 978-0470847121 Poids de l'article : 514 g Dimensions : 15.9 x 2.09 x 23.05 cm Mots-clés : electron spectroscopy  depth profiling  materials science  xps  aes Index. décimale : 621 Résumé : Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms. Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. * Includes an accessible introduction to the key spectroscopic techniques in surface analysis. * Provides descriptions of latest instruments and techniques. * Includes a detailed glossary of key surface analysis terms. Note de contenu : index An introduction to surface analysis by XPS and AES [texte imprimé] / John F. Watts, Auteur ; John Wolstenholme . - Chichester, West Sussex, England : J. Wiley, 2003 . - x, 212 p. : ill. ; 24 cm. ISBN : 0-470-84712-3 Éditeur : John Wiley & Sons Ltd; 2nd Revised edition (21 mars 2003) Langue : Anglais Relié : 224 pages ISBN-10 : 0470847123 ISBN-13 : 978-0470847121 Poids de l'article : 514 g Dimensions : 15.9 x 2.09 x 23.05 cm Mots-clés : electron spectroscopy  depth profiling  materials science  xps  aes Index. décimale : 621 Résumé : Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms. Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. * Includes an accessible introduction to the key spectroscopic techniques in surface analysis. * Provides descriptions of latest instruments and techniques. * Includes a detailed glossary of key surface analysis terms. Note de contenu : index

Exemplaires (1)

Code-barres	Cote	Support	Localisation	Section	Disponibilité
ST12238	621/16.1	Ouvrage	Faculté des Sciences et de la Technologie	600 - Technologie (Sciences appliquées)	Exclu du prêt

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