الفهرس الالي لمكتبة كلية العلوم و علوم التكنولوجيا

Titre :	An introduction to surface analysis by XPS and AES
Type de document :	texte imprimé
Auteurs :	John F. Watts, Auteur ; John Wolstenholme
Editeur :	Chichester, West Sussex, England : J. Wiley
Année de publication :	2003
Importance :	x, 212 p.
Présentation :	ill.
Format :	24 cm
ISBN/ISSN/EAN :	0-470-84712-3
Note générale :	Éditeur : John Wiley & Sons Ltd; 2nd Revised edition (21 mars 2003) Langue : Anglais Relié : 224 pages ISBN-10 : 0470847123 ISBN-13 : 978-0470847121 Poids de l'article : 514 g Dimensions : 15.9 x 2.09 x 23.05 cm
Mots-clés :	electron spectroscopy  depth profiling  materials science  xps  aes
Index. décimale :	621
Résumé :	Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms. Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. * Includes an accessible introduction to the key spectroscopic techniques in surface analysis. * Provides descriptions of latest instruments and techniques. * Includes a detailed glossary of key surface analysis terms.
Note de contenu :	index

An introduction to surface analysis by XPS and AES [texte imprimé] / John F. Watts, Auteur ; John Wolstenholme . - Chichester, West Sussex, England : J. Wiley, 2003 . - x, 212 p. : ill. ; 24 cm.
ISBN : 0-470-84712-3
Éditeur : John Wiley & Sons Ltd; 2nd Revised edition (21 mars 2003)
Langue : Anglais
Relié : 224 pages
ISBN-10 : 0470847123
ISBN-13 : 978-0470847121
Poids de l'article : 514 g
Dimensions : 15.9 x 2.09 x 23.05 cm

Mots-clés :	electron spectroscopy  depth profiling  materials science  xps  aes
Index. décimale :	621
Résumé :	Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms. Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. * Includes an accessible introduction to the key spectroscopic techniques in surface analysis. * Provides descriptions of latest instruments and techniques. * Includes a detailed glossary of key surface analysis terms.
Note de contenu :	index