الفهرس الالي لمكتبة كلية العلوم و علوم التكنولوجيا
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Advanced circuits for emerging technologies / Krzysztof Iniewski
Titre : Advanced circuits for emerging technologies Type de document : texte imprimé Auteurs : Krzysztof Iniewski Editeur : Hoboken, N.J. : John Wiley & Sons Année de publication : 2012 Importance : 615 p. Présentation : ill. Format : 24*17 cm ISBN/ISSN/EAN : 978-0-470-90005-5 Langues : Français (fre) Mots-clés : Advanced circuits for emerging technologies energy power frequency voltage nanometer cmos fedback systems management embaling optimal radio dynamic translkear high speed current communication transmission surfing interconnectmagnetic materials nanoelectronic Index. décimale : 621.38 Résumé : The book will address the–state–of–the–art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three–dimensional (3–D) CMOS integration and co–integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies.
The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.Note de contenu : Poids de l'article : 990 g
Relié : 632 pages
ISBN-10 : 0470900059
Dimensions : 16.51 x 3.81 x 24.13 cm
ISBN-13 : 978-0470900055
Éditeur : Wiley–Blackwell (12 juin 2012)
Langue : : AnglaisAdvanced circuits for emerging technologies [texte imprimé] / Krzysztof Iniewski . - Hoboken, N.J. : John Wiley & Sons, 2012 . - 615 p. : ill. ; 24*17 cm.
ISBN : 978-0-470-90005-5
Langues : Français (fre)
Mots-clés : Advanced circuits for emerging technologies energy power frequency voltage nanometer cmos fedback systems management embaling optimal radio dynamic translkear high speed current communication transmission surfing interconnectmagnetic materials nanoelectronic Index. décimale : 621.38 Résumé : The book will address the–state–of–the–art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three–dimensional (3–D) CMOS integration and co–integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies.
The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.Note de contenu : Poids de l'article : 990 g
Relié : 632 pages
ISBN-10 : 0470900059
Dimensions : 16.51 x 3.81 x 24.13 cm
ISBN-13 : 978-0470900055
Éditeur : Wiley–Blackwell (12 juin 2012)
Langue : : AnglaisRéservation
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Code-barres Cote Support Localisation Section Disponibilité ST7015 621.38/268.1 Ouvrage Faculté des Sciences et de la Technologie 600 - Technologie (Sciences appliquées) Exclu du prêt ST7016 621.38/268.2 Ouvrage Faculté des Sciences et de la Technologie 600 - Technologie (Sciences appliquées) Disponible An introduction to network modeling and simulation for the practicing engineer / Jack Burbank
Titre : An introduction to network modeling and simulation for the practicing engineer Type de document : texte imprimé Auteurs : Jack Burbank, Auteur ; William Kasch, Autre ; Jon Ward, Autre Editeur : Hoboken, N.J. : John Wiley & Sons Année de publication : cop. 2011 Collection : ComSoc guides to communications technologies Importance : 1 online resource (1 texte électronique (xi, 203 p.)) ISBN/ISSN/EAN : 978-1-118-06365-1 Note générale : Titre An Introduction to Network Modeling and Simulation for the Practicing Engineer
The ComSoc Guides to Communications Technologies
Auteurs Jack L. Burbank, William Kasch, Jon Ward
Édition illustrée
Éditeur John Wiley & Sons, 2011
ISBN 1118063643, 9781118063644
Longueur 216 pagesLangues : Anglais (eng) Mots-clés : physical layer modeling medium access control higher layer portocols loop simulation network modeling other vital aspect Index. décimale : 620 Résumé : This book provides the practicing engineer with a concise listing of commercial and open-source modeling and simulation tools currently available including examples of implementing those tools for solving specific Modeling and Simulation examples. Instead of focusing on the underlying theory of Modeling and Simulation and fundamental building blocks for custom simulations, this book compares platforms used in practice, and gives rules enabling the practicing engineer to utilize available Modeling and Simulation tools. This book will contain insights regarding common pitfalls in network Modeling and Simulation and practical methods for working engineers
Jack L. Burbank leads the Wireless Networking section within the Communications and Network Technologies group of The Johns Hopkins University Applied Physics Laboratory (JHU/APL). Mr. Burbank is an expert in the areas of wireless networking and modeling and simulation, focusing on the application and evaluation of wireless networking technologies to the military context. His team of network engineers at JHU/APL participates within the Internet Engineering Task Force (IETF) and the IEEE 802 standards organization. Mr. Burbank is a professor of networking and telecommunications in The Johns Hopkins University Part-Time Engineering Program, and is a member of the IEEE and ASEE.
William T. Kasch received a B.S. in Electrical Engineering at the Florida Institute of Technology in 2000 and an M.S. in Electrical and Computer Engineering at the Johns Hopkins University in 2003. His interests include various aspects of wireless networking, including MANET, IEEE 802 technology, and cellular. He participates actively in both the IEEE 802 standards organization and the Internet Engineering Task Force.
Jon R. Ward works in the wireless networking section of the communications and networking technology (VCT) group atT he Johns Hopkins University Applied Physics Laboratory (JHU/APL) in Laurel, MD. He has worked projects focusing on network design and interference testing of standards-based wireless technologies such as IEEE 802.11, IEEE 802.15.4, and IEEE 802.16.Note de contenu : In Wiley online library
Titre de l'écran-titre (visionné le 7 décembre 2011)
BibliogrAn introduction to network modeling and simulation for the practicing engineer [texte imprimé] / Jack Burbank, Auteur ; William Kasch, Autre ; Jon Ward, Autre . - Hoboken, N.J. : John Wiley & Sons, cop. 2011 . - 1 online resource (1 texte électronique (xi, 203 p.)). - (ComSoc guides to communications technologies) .
ISBN : 978-1-118-06365-1
Titre An Introduction to Network Modeling and Simulation for the Practicing Engineer
The ComSoc Guides to Communications Technologies
Auteurs Jack L. Burbank, William Kasch, Jon Ward
Édition illustrée
Éditeur John Wiley & Sons, 2011
ISBN 1118063643, 9781118063644
Longueur 216 pages
Langues : Anglais (eng)
Mots-clés : physical layer modeling medium access control higher layer portocols loop simulation network modeling other vital aspect Index. décimale : 620 Résumé : This book provides the practicing engineer with a concise listing of commercial and open-source modeling and simulation tools currently available including examples of implementing those tools for solving specific Modeling and Simulation examples. Instead of focusing on the underlying theory of Modeling and Simulation and fundamental building blocks for custom simulations, this book compares platforms used in practice, and gives rules enabling the practicing engineer to utilize available Modeling and Simulation tools. This book will contain insights regarding common pitfalls in network Modeling and Simulation and practical methods for working engineers
Jack L. Burbank leads the Wireless Networking section within the Communications and Network Technologies group of The Johns Hopkins University Applied Physics Laboratory (JHU/APL). Mr. Burbank is an expert in the areas of wireless networking and modeling and simulation, focusing on the application and evaluation of wireless networking technologies to the military context. His team of network engineers at JHU/APL participates within the Internet Engineering Task Force (IETF) and the IEEE 802 standards organization. Mr. Burbank is a professor of networking and telecommunications in The Johns Hopkins University Part-Time Engineering Program, and is a member of the IEEE and ASEE.
William T. Kasch received a B.S. in Electrical Engineering at the Florida Institute of Technology in 2000 and an M.S. in Electrical and Computer Engineering at the Johns Hopkins University in 2003. His interests include various aspects of wireless networking, including MANET, IEEE 802 technology, and cellular. He participates actively in both the IEEE 802 standards organization and the Internet Engineering Task Force.
Jon R. Ward works in the wireless networking section of the communications and networking technology (VCT) group atT he Johns Hopkins University Applied Physics Laboratory (JHU/APL) in Laurel, MD. He has worked projects focusing on network design and interference testing of standards-based wireless technologies such as IEEE 802.11, IEEE 802.15.4, and IEEE 802.16.Note de contenu : In Wiley online library
Titre de l'écran-titre (visionné le 7 décembre 2011)
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Code-barres Cote Support Localisation Section Disponibilité ST99 620/202.1 Ouvrage Faculté des Sciences et de la Technologie 600 - Technologie (Sciences appliquées) Disponible ST300 620/202.2 Ouvrage Faculté des Sciences et de la Technologie 600 - Technologie (Sciences appliquées) Disponible Fundamentals of optical fibers / John A. Buck
Titre : Fundamentals of optical fibers : second edition Type de document : texte imprimé Auteurs : John A. Buck Mention d'édition : 2nd ed. Editeur : Hoboken, N.J. : John Wiley & Sons Année de publication : 2004 Importance : xvii, 332 p. Présentation : ill. Format : 25 *18cm ISBN/ISSN/EAN : 978-0-471-22191-3 Note générale : "A Wiley-Interscience publication." Mots-clés : Fundamentals of optical fibers selected topic symmetric dielectric weakleay guiding loss mechanism dispertion special purpose nonlinear effects Index. décimale : 621.38 Résumé : "Substantially rewritten, Fundamentals of Optical Fibers, Second Edition offers readers a timely and consistent introduction to the fundamental principles of light propagation in fibers. Incorporating the many developments in the field since the first edition appeared in 1995, this new edition reviews, in-depth, fundamental waveguiding principles, the influence of various fiber structures and materials on light transmission, and nonlinear propagation effects. Since the main applications of optical fibers occur within communication systems, the focus throughout is on topics that pertain to that domain."--Résumé de l'éditeur. SOMMAIRE:SELECTED TOPICS IN ELECTROMAGNETIC WAVE PROPAGATION-SYMMETRIC DIELECTRIC SLAB WAVEGUIDES-WEAKLY-GUIDING FIBERS WITH STEP INDEX PROFILES-LOSS LECHANISMS IN SILICA FIBER-DISPERSION-SPECIALPURPOSE INDEX PROFILES-NONLINEAR EFFECTS IN FIBERS1:NONERSONANT PROCESSES-NONLINEAR EFFECTS IN FIBRES2:RESONANT PROCESSES AND AMPLIFICATION Fundamentals of optical fibers : second edition [texte imprimé] / John A. Buck . - 2nd ed. . - Hoboken, N.J. : John Wiley & Sons, 2004 . - xvii, 332 p. : ill. ; 25 *18cm.
ISBN : 978-0-471-22191-3
"A Wiley-Interscience publication."
Mots-clés : Fundamentals of optical fibers selected topic symmetric dielectric weakleay guiding loss mechanism dispertion special purpose nonlinear effects Index. décimale : 621.38 Résumé : "Substantially rewritten, Fundamentals of Optical Fibers, Second Edition offers readers a timely and consistent introduction to the fundamental principles of light propagation in fibers. Incorporating the many developments in the field since the first edition appeared in 1995, this new edition reviews, in-depth, fundamental waveguiding principles, the influence of various fiber structures and materials on light transmission, and nonlinear propagation effects. Since the main applications of optical fibers occur within communication systems, the focus throughout is on topics that pertain to that domain."--Résumé de l'éditeur. SOMMAIRE:SELECTED TOPICS IN ELECTROMAGNETIC WAVE PROPAGATION-SYMMETRIC DIELECTRIC SLAB WAVEGUIDES-WEAKLY-GUIDING FIBERS WITH STEP INDEX PROFILES-LOSS LECHANISMS IN SILICA FIBER-DISPERSION-SPECIALPURPOSE INDEX PROFILES-NONLINEAR EFFECTS IN FIBERS1:NONERSONANT PROCESSES-NONLINEAR EFFECTS IN FIBRES2:RESONANT PROCESSES AND AMPLIFICATION Exemplaires (1)
Code-barres Cote Support Localisation Section Disponibilité ST2346 621.38/86.1 Ouvrage Faculté des Sciences et de la Technologie 600 - Technologie (Sciences appliquées) Exclu du prêt